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topcon corporation surface inspection device wm-10
Surface Inspection Device Wm 10, supplied by topcon corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/surface+inspection+device+wm-10/surface+analyzer+wm+100/us11905490-83-59-62
Average 90 stars, based on 1 article reviews
surface inspection device wm-10 - by Bioz Stars, 2026-10
90/100 stars

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Article Title: Cleaning liquid composition
Article Snippet: The washed wafer was rinsed with 300 mL of ultrapure water (DIW) for 30 seconds while rotating, and further dried at 25° C. for 30 seconds while rotating, to obtain a wafer for measurement. (Measurement of the Number of Defects on the Wafer Surface) The number of defects on the above wafer surface for measurement was measured by a surface inspection device (Topcon Corporation, model number: WM-10), and the cleaning property of the cleaning liquid composition was evaluated.



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topcon corporation surface inspection device wm-10
Surface Inspection Device Wm 10, supplied by topcon corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/surface+inspection+device+wm-10/surface+analyzer+wm+100/us11905490-83-59-62
Average 90 stars, based on 1 article reviews
surface inspection device wm-10 - by Bioz Stars, 2026-10
90/100 stars
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